Abstract
A dual-comb-based asynchronous optical sampling (ASOPS) pump-probe measurement system is demonstrated for characterizing the relaxation dynamics in a photo-excited self-assembled InAs quantum dot (QD) semiconductor. Although the photo-excited QD material has multiple complex relaxation processes, the transient transmittance responses (from femtoseconds to nanoseconds) are successfully obtained within a sub-second short acquisition time by using the ASOPS system. This is achieved with high stability and an extremely wide temporal dynamic range of approximately 105. The utility of the developed system is demonstrated as a powerful and easy-to-use measurement tool for studying the complex photo-excited dynamics of QD materials.
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