Abstract
A dual-beam interferometer system is presented for performing reflectivity and absorption measurements in the 10–400-cm−1 far-infrared region. This system is designed for cryogenic applications intended for solid state spectroscopy. It consists of two coupled interferometers for optical difference measurements. Dual-beam interferometry is useful when conventional interferograms are digitization noise limited. The method of optical subtraction is presented and compared with methods based on electronic subtraction. The enhancement of dynamic range by this method increases the photometric accuracy (≥0.1%). Possible sources of errors such as offset of simultaneously recorded interferograms are discussed and analytical methods for their correction are presented.
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