Abstract
The Bremen drop tower at the Center of Applied Space Technology and Microgravity (ZARM) provides high quality micro-g condition needed for many high precision tests. This is even more improved by the development of a free flyer technology. This new technology is used for a free fall test of the MICROSCOPE differential accelerometers which only can work with a residual acceleration disturbance level below 25 nano-g in the high resolution mode. The French MICROSCOPE space mission for testing the Weak Equivalence Principle is scheduled for 2012/2013. The free fall accelerometer test campaign at ZARM is an important part of the pre-mission test program. In this article the new free flyer technology, its performance as well as the accelerometer tests are described.
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