Abstract

Presently, there is a growing demand from the industry for microprocessing of materials. In particular, for applications in the field of microsystems technology it is necessary to produce structures with dimensions down to the micrometer scale especially in materials that could not or not good processed by conventional microelectronic technologies.We have been investigating the drilling of anodic bondable PYREX glass by means of laser microprocessing using the excimer laser mask projection technique (248 nm or 193 nm wavelength, 10 ns pulse duration, 8 mJ pulse energy, 500 Hz repetition rate). We will show the dependence of the processing results on the laser parameters. The diameter of the holes ranges from 30 to 100 micron at the front side and from 1 to 50 micron at the rear side of the 500 micron thick wafer.We observed the formation of cracks in the laser processed region. Accordingly, we found distinct relations between the process parameters and the quality of the walls of the drilled holes. Especially the change from 248 to 193 nm Wavelength led to a distinct decrease of crack formation but the wall at the rear side of the wafer shows still a break off of some material. As solution the drilling of the wafer from both sides of the wafer allows us to produce crack free holes.Presently, there is a growing demand from the industry for microprocessing of materials. In particular, for applications in the field of microsystems technology it is necessary to produce structures with dimensions down to the micrometer scale especially in materials that could not or not good processed by conventional microelectronic technologies.We have been investigating the drilling of anodic bondable PYREX glass by means of laser microprocessing using the excimer laser mask projection technique (248 nm or 193 nm wavelength, 10 ns pulse duration, 8 mJ pulse energy, 500 Hz repetition rate). We will show the dependence of the processing results on the laser parameters. The diameter of the holes ranges from 30 to 100 micron at the front side and from 1 to 50 micron at the rear side of the 500 micron thick wafer.We observed the formation of cracks in the laser processed region. Accordingly, we found distinct relations between the process parameters and the quality of the walls of the drilled holes. Especi...

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.