Abstract
Polymeric integrated Young interferometer sensor chips utilizing a slot waveguide have demonstrated to be sensitive, to work at visible wavelengths, to be manufacturable by simple process, and to have a reduced sensitivity to temperature fluctuations. Although slot waveguide Young interferometers have these desirable features for low-cost rapid diagnostics, the sensor readout is disturbed by mechanical drifts of the sensing system. In this paper we demonstrate that mechanical drifts of the readout system can be compensated by using a multichannel slot waveguide Young interferometer having two reference waveguides and applying a drift compensation method based on the analysis of the spatial shifts of the interferogram fringes. The applicability of the drift compensation method was studied by conducting experiments with undisturbed and with mechanically disturbed setup to measure the phase changes induced by the changes of the bulk refractive index. By applying the drift compensation method, the sample induced phase change responses were extracted from up to 18 times larger measured phase changes in the disturbed experiments proving the applicability of the method with multichannel slot waveguide Young interferometers.
Highlights
Integrated Young interferometers (YI) have been demonstrated to be a sensitive label free sensor platform being able to detect bulk refractive index (RI) differences in the level of 10−5–10−8 refractive index units (RIU) [1]–[3]
In this paper we study whether mechanical drifts of the readout system can be compensated by using a multichannel slot waveguide Young interferometer having two reference waveguides and the drift compensation method based on the analysis of the spatial shifts of the interferogram fringes
Responses of the sensor chip to the bulk RI changes were first determined with an undisturbed setup by exposing the sensor chip to 500 μl pulses of glucose solutions followed by flushing with water
Summary
Integrated Young interferometers (YI) have been demonstrated to be a sensitive label free sensor platform being able to detect bulk refractive index (RI) differences in the level of 10−5–10−8 refractive index units (RIU) [1]–[3]. Authors have presented a theory for this approach where spatial shifts of the interferogram fringes are used to calculate the drift compensation [11] It was demonstrated by using a polymeric multichannel inverted ridge waveguide YI chip that the compensation method is capable to quantitatively extract sample induced bulk RI changes even though the measurement setup was deliberately mechanically disturbed. In this paper we study whether mechanical drifts of the readout system can be compensated by using a multichannel slot waveguide Young interferometer having two reference waveguides and the drift compensation method based on the analysis of the spatial shifts of the interferogram fringes For this purpose, two sets of measurements were done: the first set was conducted with an undisturbed setup, and the second set with a mechanically disturbed setup. The obtained response values of the undisturbed and disturbed experiments were compared to analyse the applicability of the compensation method
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