Abstract
A double sample holder supporting both a metal sample and an insulator crystal for high-resolution scanning probe microscopy experiments is described. The metal sample serves as a substrate for tip preparation and tip functionalization to efficiently and reliably enable high-resolution studies of the adjacent insulator surface. Imaging of Ag(111)/mica, Au(111)/mica, CaF2(111), and calcite(104) surfaces is demonstrated at 5K, including images on calcite(104) produced with a CO terminated tip, which was prepared on the adjacent metal sample.
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