Abstract
The optimum signal processing of two close pulses produced by ionization of two close fast particles in a semiconductor drift detector is presented. The optimum is relative to the determination of charges produced by each particle and the average drift times for the released charges to reach the anode. The resolution of the charge and the drift time measurements in the presence of additive and nonadditive noises have been theoretically studied as functions of the distance between two fast ionizing particles and the amount of ionization produced by individual particles. Is it shown that the precision of the position determination of the individual particles remains good enough also in the case of a significant overlap of the two pulses.
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