Abstract

Experimental cross sections for single and double ionization of ${\mathrm{H}}_{2}\mathrm{O}$ by swift ${\mathrm{H}}^{+}$ with energy ranging from 0.3 to 2.0 MeV are reported. In this energy range the ionization is the dominant collision process and charge transfer reactions can be disregarded. A multihit coincidence technique is used to measure the ${\text{H}}^{+}+{\text{OH}}^{+}$ and ${\text{H}}^{+}+{\text{O}}^{+}$ fragmentation channels. Single- and double-hit differential measurements together with a semiempirical calculation allow separating quantitatively the prompt and Auger-like decay contributions to fragmentation following a vacancy in the $2{a}_{1}$ molecular orbital. Concerning the double-ionization channel, it is found that for lower energies the mechanism of a sequential double-electron removal, known as TS2, dominates. For energies above above 750 keV/u ionization resulting from a single vacancy followed by an Auger like deexcitation takes over the TS2, becoming the main contribution to the double-ionization cross section. Our results are compared to the electron-impact data within the same velocity range and also with theoretical calculations available in the literature.

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