Abstract
Stress measurements of coarse-grained material are difficult using synchrotron X-ray diffraction because the diffraction patterns of coarse-grained materials are spotty. In addition, the center of the diffraction pattern is unknown for the transmitted X-ray beam. Here, a double-exposure method is proposed as the countermeasure against this issue. In the experiment, we introduce a CdTe pixel detector. The detector is a newly developed area detector and can resolve high-energy X-rays. The strains of the coarse-grained material can be measured using a combination of the double-exposure method, white synchrotron X-ray, and the CdTe pixel detector. The bending stress in an austenitic stainless steel plate was measured using the proposed technique. As a result, the measured stress corresponded to the applied bending stress.
Highlights
A high-energy synchrotron X-ray between 30 keV and 1 MeV has a large penetration depth and directivity, and has an excellent beam quality [1]
The count of the pixel with an increase in the threshold voltage is equivalent to the integrated value from the threshold X-ray energy of the X-ray diffraction to high energy
The features of the CdTe pixel detector are the determination of the X-ray energy and detection of high-energy X-rays
Summary
A high-energy synchrotron X-ray between 30 keV and 1 MeV has a large penetration depth and directivity, and has an excellent beam quality [1]. Internal stresses can be measured using strain scanning with hard synchrotron X-rays, and the method is used widely in industry [2]. The use of the strain scanning method is limited as the diffraction ring from the gauge volume should be continuous. The diffraction pattern from coarse grains is spotty, and an area detector must be used to measure the diffraction spots. In the DSTM, scanning the gauge-volume that is made by the rotating slit-system in the sample, the diffraction spots using an area detector are recorded. Both of the intensity and position of each diffraction spot have to be traced. The rotating slit-system of the DSTM is complicated, and the analysis for the DSTM is difficult
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