Abstract
Phase change memory (PCM) has emerged as a promising candidate to replace DRAM in embedded systems with its attractive features. However, the endurance of PCM greatly limits its adoption in embedded systems. It can only sustain a limited number of write operations. To solve this issue, we propose a simple, novel, and effective wear leveling technique, called Double Circulation Wear Leveling (DCWL), to evenly distribute write activities across the PCM chips. The basic idea is to periodically move the hot region across the whole PCM chips. When a movement of the hot region is triggered, several small areas in the hot region move to the right. The experimental results show that our wear leveling technique can effectively improve the lifetime of PCM chips compared with the previous work.
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