Abstract
AbstractAn experimental setup is presented that enables the whole optical characterization of an anisotropic medium to be achieved at the same spot. Based on total internal reflection measurements, the Double Arm Pulfrich Refractometer provides high precision simultaneous refractive index data, which are gathered without moving the sample. This technique is particularly well suited to the case of biaxial materials. Illustration of its potential is given on some preliminary orientation measurements of biaxially stretched polystyrene films.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
