Abstract
The radiation-induced electrical conductivity (RIC), has been measured for single crystal MgO at dose rates between 10 2 and 10 7 Gy h −1 and temperatures from 14 to 450°C. A correlation is observed between the RIC dose rate dependence, and the thermal stability of well defined electron and hole traps, in agreement with the model of Klaffky et al. The dose rate dependence factor is observed not to be constant, but to depend on dose rate. The possible effects of displacement damage and radiation induced impurity diffusion are noted.
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