Abstract
In an electron mirror interference microscope (1) two coherent partial waves are reflected by an electrostatic mirror (Fig.1). The mirror surface (“object”) is slowly tilted using a cylindrical piezo-ceramic spacer (€ = Δl/Δ U = 6 Å/V) one cm in length and one cm in diameter which produces a tilt angle of Δl/s = ɛ-Δu/s where s is the length of the lever arm (Fig.2). The piezo-voltage U is increased linearly with time so that two points at a lateral distance Δx on the mirror surface move with velocities perpendicular to the mirror which differ from each other by Δv = ɛ(dU/dt)Δx/s. The two partial waves reflected at the mirror at a lateral distance Δx from each other suffer a Doppler frequency shift ΔrD= ΔE/h. ΔE = (4/3)mvΔv = (4/3)hΔv/λ is the difference of the energies taken up by the electrons of the two partial beams when they are reflected from the moving mirror, taking into account that the reflection consists of a continuous deceleration and reacceleration in the homogeneous field in front of the mirror surface (2).
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