Abstract
Significant exchange bias effect is observed in the granular Ni1-xZnxO film prepared by sol-gel dip-coating technique on a silicon single crystal (100) substrate. Atomic force microscopy reveals the crystallite size which is commensurate with that obtained from the analysis of X-ray diffraction studies. Magnetization measurement reveals the blocked state of Ni0.95Zn0.05O below 155 K. On the other hand, the uncompensated spin is inferred for Ni0.97Zn0.03O from the low temperature up turn of the magnetization. The systematic shift of the magnetic hysteresis loop of Ni1-xZnxO film is measured in field cooled mode. This is the fingerprint of exchange bias (EB) effect which is found to depend strongly on x. The pinning mechanism at the interface between antiferromagnetic core and shell consisting of uncompensated spins in the granular Ni1-xZnxO film is proposed for interpreting the EB effect.
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