Abstract

Transparent conducting tin doped zinc oxide thin films were prepared by nebulizer spray pyrolysis technique for different doping concentrations. The structural properties was investigated using X-ray diffraction analysis which ensured that the polycrystalline nature of the zinc oxide with hexagonal wurtzite structure. The surface properties were analyzed by scanning electron microscope and atomic force microscope. The Energy Dispersive X-ray spectroscopy ensures that the presence of Zn, O and Sn elements in the deposited films. Optical transmissions of the films exhibit for undoped film is 75%, which is improved up to 93% for tin doped films and the optical absorption is below 1.7%. The band gap energy of the films is achieved in the range of 3.54–3.67 eV. From the Hall Effect measurements we observed a minimum resistivity (9.2 × 10−4 Ω-cm) and maximum carrier concentration (7.4 × 1021 cm−3).

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