Abstract
Silicon surface etching and its dominant rate process are studied using hydrogen chloride gas in a wide concentration range of 1–100% in ambient hydrogen at atmospheric pressure in a temperature range of 1023–1423 K, linked with the numerical calculation accounting for the transport phenomena and the surface chemical reaction in the entire reactor. The etch rate, the gaseous products and the surface morphology are experimentally evaluated. The dominant rate equation accounting for the first-order successive reactions at silicon surface by hydrogen chloride gas is shown to be valid. The activation energy of the dominant surface process is evaluated to be 1.5 × 10 5 J mol − 1. The silicon deposition by the gaseous by-product, trichlorosilane, is shown to have a negligible influence on the silicon etch rate.
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