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Abstract
The switching processes in lead titanate thin films in subcritical rectangular pulsed fields have been investigated. Based on the obtained results, the dynamic exponent factor in the dependence of the domain wall velocity on the value of external field has been evaluated. It was shown that the value of the exponent factor increases as the film thickness decreases. The growth of the dynamic factor is associated with an increase in the crystallite axes orientation, when the thickness of polycrystalline films decreases.
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