Abstract

Abstract We study the domain wall depinning from a triangle-shaped notch in Ni80Fe20/Pt bilayer nanostrips using electrical detection technique. It is found that for the 630 nm wide strip, the depinning fields are distributed in a narrow range. While for the 300 nm wide strip, the depinning fields are distributed in two distinctly separated ranges. Micromagnetic simulations show that for the 630 nm wide strip, the depinning corresponds to vortex domain wall, while for 300 nm wide strip, the depinnings of both the vortex wall and the transverse wall are observed. The chirality of vortex wall and the polarity of transverse wall have strong influence on the depinning field. Electrical current has a clear impact on the depinning, but its influence is different for different wall configuration. It can decrease or slightly increase the depinning field of the vortex domain wall depending on the wall chirality and the current direction. The depinning field of the transverse domain wall exhibits an oscillation variation with the current density. Compared to the depinning process of the domain wall in a control sample Ni80Fe20/Au, it can be inferred the current influence on the domain wall depinning is caused mainly by the current-induced spin-orbit torque.

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