Abstract
High resolution x-ray diffraction data indicate ordered square shaped coherent domains, ∼1200Å in length, coexisting with longer, ∼9500Å correlated regions in highly strained 5 ML SrTiO3 films grown on Si(001). These long range film structures are due to the Si substrate terraces defined by the surface step morphology. The silicon surface “step pattern” is comprised of an “intrinsic” terrace length from strain relaxation and a longer “extrinsic” interstep distance due to the surface miscut.
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