Abstract
Transmission electron microscopy in Lorentz mode was employed to observe the domains of Co-Cr films which were prepared by magnetron sputtering. The variation of domain structures with thickness, composition and magnetization history of the films has been studied. It is found that the domain structure of Co-20% Cr(at) film is very closely related to the thickness of films. The Lorentz micrograph of the film with thickness of 20 nm shows a feather-like domain, and the 100 nm thick film has a typical dotted pattern. The difference in domain structure of films is caused by the c-axis orientation. The domain structures of Co-Cr film vary greatly with the chromium content. It is observed that the domain size at remnance is affected by its magnetization history. For same magnetization history the domain pattern of Co-4.9% Cr film is different from that of Co-20% Cr film.
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