Do ESD fails in systems correlate with IC ESD robustness?

Abstract

Integrated circuits (ICs) are qualified for their electrostatic discharge (ESD) robustness according to the well-known IC ESD standards Human Body Model, Machine Model, and Charged Device Model in order to guarantee safe handling in ESD protected areas. For electronic systems like mobile phones which are in direct use by consumers, certain robustness against system level ESD is demanded, too. As the ESD test methods of device and system level stress are completely different (waveforms, stress application, operating condition of the DUT, etc.), correlations between models of both worlds are difficult to establish. Therefore, the system vendors more and more demand a specified ESD robustness for devices (ICs) according to an ESD system level standard. Testing ICs to a system level ESD standard requires careful considerations; first ideas are summarized in the new Standard Practice “Human Metal Model” of the ESDA/ANSI. However, the approach of deriving system ESD robustness from IC robustness is currently too much simplified and bears severe potential risks. Nevertheless, there are methodologies and approaches to use IC ESD characterization for defining ESD protection concepts for systems. Appropriate high-current characterization of ICs can be the cornerstone for a successfully optimized system ESD protection.