Abstract
SynopsisThe interaction of high-energy radiation with the biological matter produces copious amounts of non-thermal secondary low energy electrons (LEEs; 0-30 eV). Several studies have shown that 5-15 eV electrons induce different types of DNA damage by the formation of transient negative ions (TNIs), decaying into the dissociative elec-tron attachment (DEA) process [1,2]. Here, our main focus is to understand the chemical mechanism of damage by very low energy electrons (vLEEs∼1.8 eV) by using TpT as a simple model of DNA, solid-state LEE irradiation methods and LC-MS/MS analysis of the degradation products.
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