Abstract
The distribution of waiting times between elementary tunneling events is of fundamental importance for understanding the stochastic charge transfer processes in nanoscale conductors. Here we investigate the waiting time distributions (WTDs) of periodically driven single-electron emitters and evaluate them for the specific example of a mesoscopic capacitor. We show that the WTDs provide a particularly informative characterization of periodically driven devices and we demonstrate how the WTDs allow us to reconstruct the full counting statistics (FCS) of charges that have been transferred after a large number of periods. We find that the WTDs are capable of describing short-time physics and correlations which are not accessible via the FCS alone.
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