Distribution of trap levels in field stimulated exoelectron emission

Abstract

Trap levels of exoelectrons in high purity aluminum were estimated from the emission properties of field stimulated exoelectrons. The trap level of exoelectron in 99.9999% pure aluminum was found at about 0.2 eV higher than the Fermi level of aluminum and those in less pure aluminum were distributed in a higher energy region. The observed distribution of exoelectron trap levels agrees with the trap level determined by photostimulated exoelectron emission and also explains the glow curves of field stimulated exoelectron emissions from aluminum specimens of different purities.