Abstract
Trap levels of exoelectrons in high purity aluminum were estimated from the emission properties of field stimulated exoelectrons. The trap level of exoelectron in 99.9999% pure aluminum was found at about 0.2 eV higher than the Fermi level of aluminum and those in less pure aluminum were distributed in a higher energy region. The observed distribution of exoelectron trap levels agrees with the trap level determined by photostimulated exoelectron emission and also explains the glow curves of field stimulated exoelectron emissions from aluminum specimens of different purities.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.