Abstract

The method of inverse-problem analysis was used to determine the distribution of heat-transfer coefficients of a silicon heater cooled with submerged jets of fluorocarbon liquid. The silicon heater was made specifically to investigate high-performance cooling systems of electronic devices. The heater is constructed of many cells which can independently generate heat and measure the temperature on one side of the heater, and it is colled from the other side of the heater. Inverse-problem analysis was used to correct for heat conduction in the heater and to determine the distribution of heat transfer coefficients on the cooling surface. The heat-transfer coefficients were also measured by independent techniques to confirm the values determined with the inverse-problem analysis. One of these independent techniques was to control the heater power to produce a uniform temperature. Another technique was to use a SUS film heater. The distribution of heat transfer coefficients determined with these three techniques were in reasonable agreement.

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