Abstract
ESD protection is critical to RF (Radio Frequency) circuits. However, linearity and parasitic capacitance that ESD protection devices present adversely affect the performance of such circuits. To address challenges in millimeter-wave RF I/O ESD protection, a robust ESD solution with adjustable working frequency is proposed. The design methodology is demonstrated through an example design. S-parameters characterization and ESD test using TLP electrical stress are presented to verify the proposed design.
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