Distinguishing between Chi and Sigma phases in duplex stainless steels using potentiostatic etching

Abstract

A color interference film etching technique based on the principle of potentiostatic etching has been developed to distinguish, by optical metallography, between Cr-rich sigma and Mo-rich chi phases as well as with simultaneous identification of the ferrite and austenite phases in duplex stainless steels. The optical metallography results are confirmed by semi-quantitative energy dispersive spectrometry analysis and back-scattered electron imaging. The technique is relatively simple and rapid, and makes use of low voltages and a hot etchant. Results have shown distinctively the sigma, chi, ferrite, and austenite phases, and enable observation of the microstructural development, morphology, and kinetics of formation of the phases in duplex alloys. The method, by giving excellent color contrast between sigma and chi, also facilitates quantitative image analysis of the sigma and chi volume fractions.