Abstract
Emission spectra induced by electron impact on some gaseous organosilicon compounds were measured by a single photon counting technique. Vinyltrimethylsilane and vinyltrimethoxysilane showed emission bands assigned to decomposition products, CH, H, and Si atom, and trimethylsilylacetylene and Trimethyl(2-propynyloxy)silane produced C2 in addition to CH, H, and Si atom, indicating that C2 species was originated from C≡C moiety in the parent mlecules. From the comparison of the emission intensity of Si atom produced from each parent molecule, it is concluded that cleavage of Si-C bond is easier than that of Si-O bond. By mixing acrolein molecule into the organosilicon compounds, emission intensity of Si atom decreased, suggesting that acrolein molelcule interacted with the organosilicon compounds to suppress the generation of Si atom.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
