Abstract

The effects of probe displacement errors in the near-field measurement procedure on the far-field spectrum are studied. Expressions are derived for the displacement error functions that maximize the fractional error in the spectrum for both the on-axis and off-axis directions. The x- y- and z-displacement error in planar scanning are studied and the results are generalized to errors in spherical scanning. Some simple near-field models are used to obtain order-of-magnitude estimates for the fractional error as a function of relevant scale lengths of the near-field, defined as the lengths over which significant variations occur. >

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.