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Abstract
A large set of InGaAs photodiodes from different manufacturers has been irradiated with electrons of 0.5-20 MeV, with protons of 60, 100, and 170 MeV, and with atmospheric-like neutron spectrum. Depending on the type of incident particles and energy, the deposited damage dose has been evaluated in the ~5 × 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">6</sup> to 5 × 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">9</sup> MeV/g range. The dark current damage factor has been extracted from measurements at different fluence levels. The dark current data right after irradiation and 2 months later allow for evaluating any possible annealing processes. The damage factor measured after about 2 months has been scaled with nonionizing energy loss (NIEL). Finally, the validity of NIEL scaling is discussed for InGaAs materials.
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