Abstract
The transient hole transport in poly( $p$-phenylene vinylene) (PPV) is investigated by measuring the response times of PPV-based light-emitting diodes. It is demonstrated that the observed response times are governed by the dispersive transport of holes in PPV. In terms of the stochastic transport model of Scher and Montroll, the results correspond to a dispersion parameter $\ensuremath{\alpha}\phantom{\rule{0ex}{0ex}}=\phantom{\rule{0ex}{0ex}}0.45$, independent of temperature. This indicates that the dispersion in hole transport in PPV is due mainly to structural disorder, rather than to energetic disorder.
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