Abstract
A back illuminated x-ray CCD detector working in single photon counting mode is described for absolute measurement of x-ray emission spectrum without any additional dispersive device. Image analysis software has been developed to reconstruct the x-ray spectra even from a CCD frame which was exposed above the single photon counting threshold. Characterization of the spectrograph was carried out by measurement of characteristic line and continuum x-ray emission from high intensity femtosecond laser produced plasma in the 2–20 keV energy range. The resolution of spectrograph is ∼ 3% at 4.5 keV and ∼ 1.4% at 17.5 keV which is broadly in agreement with the theoretical value expected with the spectrograph parameters The experimentally determined calibration factor is about 20% higher than the data provided by the CCD manufacturer. The spectrograph is particularly suited for measuring the x-ray emission spectrum in a large energy interval. An example of x-ray emission spectrum from the rear side of the laser heated titanium foil is also presented.
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