Abstract
The optical constants of vacuum deposited Ge20Se80 thin films of different thicknesses (74-500 nm) were studied in the wavelength range 400-2000 nm. It was found that both the refractive index (n) and the absorption index (k) are independent of the film thickness. Analysis of the experimental data of n revealed the existence of normal dispersion and fits the Cauchy and Sellmeier dispersion formulae. The allowed optical transition was found to be a non-direct transition with an optical gap of Egopt=1.78 eV. The width of the band tail Ee was also determined and found to be 0.15 eV. The surface roughness of Ge20Se80 thin films has been found to depend linearly on the film thickness.
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