Abstract
AbstractA deformed aluminum-copper alloy was studied by X-ray diffraction. The 111 diffraction profile was found to consist of a main peak and a subpeak. They were separated by a numerical differential method combined with a non-linear least square profile fitting procedure. The subpeak could not be ascribed to the θ phase in the alloy since the intensity ratio of the subpeak to main peak is 20-30 times more than the volume ratio of the θ phase to die matrix. On the other hand, the Transmission Electron Microscope (TEM) micrographs showed clearly that there is a highly inhomogeneous dislocation distribution just like the cell structure in pure aluminum. The main X-ray peak was thus assumed to be due to diffraction from the cell interior while the subpeak is determined by the cell wall. After applying a series of standard data processing procedures based on Wilkens' theory and the Pearson VII-Voigt function, the dislocation densities in both the cell interior and wall were evaluated.
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