Dislocation structures around crack tips of fatigued polycrystalline copper

Abstract

Dislocation structures near fatigue cracks of polycrystalline copper specimens were analyzed using the electron channelling contrast imaging (ECCI) technique. Prior to the ECCI observations, optical microscopy was conducted to classify the fatigue crack morphologies into several kinds. It was found that the dislocation structures were correlated with the slip morphologies observed using the optical microscope. The cell structure almost corresponded to the severely deformed plastic zone where the individual slip bands could not be identified. The labyrinth dislocation structure was detected at the double-slip region. Ladder-like dislocation structure was detected ahead of the Stage I type fatigue crack. Hence, it can be said that the persistent slip band (PSB) was a favorable crack path. However, the microscopic route of the crack growth was not along the PSB but along the cell structure, which was developed locally in the vicinity of the crack tip.