Dislocation-Induced Stress Field in Multilayered Heterogeneous Thin Film System

Abstract

Taking advantage of the generalized Galerkin potential function and the Fourier transform, the research presented in this paper first derives the Green’s function for a multilayered heterogeneous thin film system. The area-integral expression for the stresses induced by a dislocation loop in the heterogeneous thin film system is formulated into a line-integral representation on the basis of a corollary of the Green’s theorem, which makes the accurate calculation of the dislocation stress field feasible and practical. A decomposition scheme is further presented to address the numerical singularity issue encountered in the calculation of dislocation stresses on the slip plane. Numerical results demonstrate that the layered heterogeneity of materials has considerable influence on the stress field induced by dislocation loops.