Dislocation Effects on the Diffraction Line Profiles from Nanocrystalline Domains

Abstract

A Pd nano-polycrystalline microstructure was simulated by molecular dynamics, including edge or screw dislocations in one of the 50 grains, so as to produce a realistic model of nanocrystalline domain with line defect. The same crystalline domain was also studied, with or without line defects, as a free-standing, isolated nanocrystal. Atomic coordinates of the selected domain were used to generate powder patterns by means of the Debye scattering equation, and these patterns were used as “experimental” data to test existing methods of line profile analysis in controlled condition, i.e., with known type and density of defects. Results show that the Krivolgaz–Wilkens theory of dislocation line broadening qualitatively agrees with the MD model, but errors can be larger than 50 pct. A critical issue arises from the instability of the Krivolgaz–Wilkens model when all line profile parameters are simultaneously refined: reasonable results can be obtained by fixing or restricting some parameters.