Abstract
We report that a modified Z-scan method by nonlinear ellipse rotation (NER) can be used to discriminate true nonlinear refraction from thermal effect in the transient regime and steady state. The combination of Z-scan and NER allows us to measure the third-order nonlinear susceptibility component without the influence of thermal-optical nonlinearity. The experimental results of pure CS(2) and CS(2) solutions of nigrosine verify that the transient thermal effect can be successfully eliminated from the NER-modified Z-scan measurements. This method is also extended to the case in which thermal-optical nonlinearities depend on a high repetition rate of femtosecond laser pulses for the N,N-dimethylmethanamide solutions of graphene oxide.
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