Abstract

The calculation of asymptotic limits of Feynman diagrams using Feynman parameter techniques has developed a powerful and useful technology. A major gap in this armory has concerned the calculation of specific discontinuities of Feynman diagrams. In this paper we remedy this gap and illustrate the new technique on a series of familiar situations. These includes in the Regge limit, the ladder and the AFS diagrams, and the x ∼ 1 deep inelastic electroproduction region.

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