Abstract
It was revealed that specific directional light scattering takes place in ferroelectric semiconductors in polydomain states. This scattering is observed at to the light beam direction. The behaviour of this effect suggests that it is caused by light reflection by layers formed by charge carriers which screen charged domain walls between opposing domains. The orientation of the reflecting layers was determined. This effect allows one to check easily the degree of unipolarity throughout the sample and refine optically the complete crystallographic orientation.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
