Abstract
The mechanism for the appearance of directional elastic peak electron spectroscopy (DEPES) profiles and the method of calculation of these profiles based on the single scattering cluster approximation are presented together with application of an R-factor for fitting calculated profiles to those obtained in experiment. The review of applications of DEPES in investigations of crystalline structure and crystalline order of ultra-thin layers of metals (silver, lead, antimony, cobalt) deposited in ultra-high vacuum on low-index faces of copper and nickel crystals is provided. The method used in the theoretical description of the DEPES profiles enables the population of silver islands growing on low-index faces of copper crystals with different stacking sequences of succeeding atomic layers, to be determined.
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