Directional dependent magnetization in BaFe12O19 thin film

Abstract

The thin film of BaFe12O19 (BHF) on a silicon substrate has been prepared by the pulse laser deposition method. The crystal structure, morphology, elemental analysis, and magnetic properties have been investigated by using X-Ray Diffraction (XRD), Raman spectroscopy, field emission scanning electron microscopy, elemental dispersive x-ray analysis, and vibrating sample magnetometry, respectively. The Rietveld refinement of XRD patterns of BHF powder has been performed to study the crystal structure and lattice parameters. Peak shifting in XRD pattern and Raman spectra for the thin film have been observed compared to that of powder sample. It could be due to the existence of stress at the interface of film and substrate. The magnetic hysteresis loops (M-H loops) of BHF thin film and powder were traced at 60 K and 300 K. The M-H loops of BHF suggest the hard and soft magnetic nature of powder and thin film, respectively. There is a large difference has been observed between saturation magnetization measured by applying a magnetic field parallel and perpendicular directions of the thin film. The bifurcation in zero field cooling (ZFC) and field cooling (FC) magnetization curves reveals the magnetic frustration in the thin films.