Abstract
Directed self-assembly of block copolymers is a scalable method to fabricate well-ordered patterns over the wafer scale with feature sizes below the resolution of conventional lithography. Typically, lithographically-defined prepatterns with varying chemical contrast are used to rationally guide the assembly of block copolymers. The directed self-assembly to obtain accurate registration and alignment is largely influenced by the assembly kinetics. Furthermore, a considerably broad processing window is favored for industrial manufacturing. Using an atomically-thin layer of graphene on germanium, after two simple processing steps, we create a novel chemical pattern to direct the assembly of polystyrene-block-poly(methyl methacrylate). Faster assembly kinetics are observed on graphene/germanium chemical patterns than on conventional chemical patterns based on polymer mats and brushes. This new chemical pattern allows for assembly on a wide range of guiding periods and along designed 90° bending structures. We also achieve density multiplication by a factor of 10, greatly enhancing the pattern resolution. The rapid assembly kinetics, minimal topography, and broad processing window demonstrate the advantages of inorganic chemical patterns composed of hard surfaces.
Highlights
If a material that wets PS or poly(methyl methacrylate) (PMMA) is patterned on a neutral surface, only lithography and plasma etching are needed to prepare the chemical contrast pattern
We show that chemical patterns consisting of graphene guiding stripes on germanium can direct the assembly of block copolymers into straight, parallel lamellae structures
Scanning electron microscopy (SEM) and atomic force microscopy (AFM) show that the graphene surface is uniform with low roughness of 1–2 nm over 10 × 10 μm[2] (Supplementary Fig. S1)
Summary
If a material that wets PS or PMMA is patterned on a neutral surface, only lithography and plasma etching are needed to prepare the chemical contrast pattern. Monolayer graphene grown on a germanium wafer is proposed as an appealing template to perform directed self-assembly. We demonstrate that atomically-thin graphene stripe arrays can be used as chemical patterns for directed assembly of block copolymers, resulting in well-registered lamellae patterns with complex architectures. The graphene/germanium chemical patterns enable block copolymer assembly on templates with incommensurate periods and in 90° bending structures. Density multiplication by a factor of 10 is demonstrated, which means that the period of the assembled block copolymer is one-tenth the template periodicity. These results indicate that graphene/germanium chemical patterns enable robust, reproducible directed self-assembly of block copolymers
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