Abstract
Patterning with a focused ion beam (FIB) is an extremely versatile fabrication process that can be used to create microscale and nanoscale designs on the surface of practically any solid sample material. Based on the type of ion-sample interaction utilized, FIB-based manufacturing can be both subtractive and additive, even in the same processing step. Indeed, the capability of easily creating three-dimensional patterns and shaping objects by milling and deposition is probably the most recognized feature of ion beam lithography (IBL) and micromachining. However, there exist several other techniques, such as ion implantation- and ion damage-based patterning and surface functionalization types of processes that have emerged as valuable additions to the nanofabrication toolkit and that are less widely known. While fabrication throughput, in general, is arguably low due to the serial nature of the direct-writing process, speed is not necessarily a problem in these IBL applications that work with small ion doses. Here we provide a comprehensive review of ion beam lithography in general and a practical guide to the individual IBL techniques developed to date. Special attention is given to applications in nanofabrication.
Highlights
The general term “ion beam lithography (IBL)” may be used for two different styles of ion beam processing [1, 2]
In the following list we provide some example references: (i) atomic force microscopy (AFM) [142, 143], (ii) scanning tunneling microscopy (STM) [143], (iii) magnetic force microscopy (MFM) [144], (iv) Kelvin probe force microscopy (KFM) [145], (v) near-field scanning optical microscopy (NSOM) [146, 147], (vi) scanning electrochemical microscopy (SECM) [148], (vii) scanning ion conductance microscopy (SICM) [149]
We have presented a general overview of techniques for maskless focused ion beam lithography and their applications in micro- and nanofabrication
Summary
The general term “ion beam lithography (IBL)” may be used for two different styles of ion beam processing [1, 2]. The other technique, referred to as direct-write IBL, uses a tightly focused beam of ions to form a scanned ion probe, with position and timing controlled by a pattern generator. This is followed by a review of FIB instruments, including short discussions about their components and critical features.
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