Direct solid-sampling electrothermal atomic absorption spectrometry methods for the determination of silicon in oxides of niobium, titanium and zirconium

Abstract

An electrothermal atomic absorption spectrometer with a transversely heated graphite tube and a solid sampling system based on the boat technique was used for the development of methods for direct determination of silicon in powdered niobium pentoxide, titanium dioxide and zirconium dioxide. In the analysis of niobium pentoxide, serious matrix-caused non-spectral interferences and background were avoided by conversion of the niobium pentoxide matrix into the thermally stable niobium carbide using a methane atmosphere during the pyrolysis stage. For all three materials, calibration procedures using aqueous standard solutions were developed. For titanium dioxide and zirconium dioxide, the accuracy was checked by comparison of the results with those of independent methods, whereby good agreement was achieved. Owing to the high applicable sample amount per atomization (3–15 mg) and almost complete freedom of interference from the blank, limits of detection at the 10-ng g −1 level were achieved.