Abstract
Direct photocurrent mapping of organic solar cells (OSCs) using a novel implementation of a near-field scanning optical microscope (NSOM) is described. By rastering the light output from the NSOM through a semitransparent electrode across the OSC surface, it is possible to collect height and photocurrent images simultaneously with a lateral resolution that is governed by the NSOM aperture. The photocurrent images demonstrate that film inhomogeneities and segregation effects strongly influence OSC device performance.
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