Abstract
AbstractA ferroelectric PZT thin film with (111) orientation was prepared by a sol–gel process and deposited by spin coating on a Pt(111)/Ti/SiO2/Si wafer. The three‐dimensional (in‐plane and out‐of‐plane) domain structures were in situ visualized by using scanning force microscopy in piezoresponse mode at nanoscale resolution. Both lamellar 90° and 180° domain patterns with almost equal widths of 20–30 nm were extensively observed inside single grains. The domain distribution is a result of local mechanical stress at the interface between the grain and the substrate from periodic lattice‐constant mismatch. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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