Abstract
A new method has been developed for directly visualizing electromagnetic microfields in real time by the interference of four-electron waves obtained using a transmission electron microscope equipped with a field-emission gun and two electron biprisms. When one object wave and three reference waves interfere, equal-phase lines of the object wave are displayed as the intensity modulation of the interference fringes, in the manner same as in the three-electron-wave interference. The advantage of the four-electron-wave interference is that equal-phase lines are observed without precisely adjusting the angle between the two biprisms or rigorously controlling the fringe spacings of the two biprisms.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
