Direct method to determine the elements of dielectric tensor of perpendicular magnetic films by measuring the Kerr rotation angle θk and the reflectivity R of double-layered films

Abstract

Based upon the superposition principle of the interference of light, the relationship between Kerr rotation angle θ k and reflectivity R and optical constant and the thickness of transparent dielectric layers for double-layered films has been deduced theoretically. A simple and practical analyzed method for determining the off-diagonal and diagonal elements of the dielectric tensor of magneto-optical films has been developed using the relationship express of double-layered films and the measured results of Kerr rotation angle θ k and reflectivity R. Results show that this method can solve the problem simply. The validity of the method has been verified through determination of the elements of the dielectric tensor of TbFeCo perpendicular magnetic films in double-layered films of AlN/TbFeCo/glass.