Abstract

Quartz crystal resonator measurements can be used for polymer material characterization. The non-gravimetric behavior of these resonators, i.e. the dependence of the electrical response of polymer coated quartz resonators on the polymer shear modulus, is exploited for the determination of viscoelastic material properties of the coating. Previously reported methods applied an electrical admittance analysis together with difficult and time-consuming data fit procedures to calculate the film shear modulus. This contribution presents a new direct method for the determination of complex shear moduli of polymer films from quartz crystal resonator measurements which allows a fast calculation of the shear parameters.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.